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j m lauenstein m c casey k a label single event specification

Program - Thursday - IEEE NSREC 2019

2018719- Terrestrial Neutron-Induced Single Event Burnout Cross-Sections for High-Javanainen, University of Jyvaskyla; J.-M. Lauenstein, NASA GSF

single-event upset tolerance: Topics by Science.gov

256K static random access memories (SRAMs) can on the problem of Single Events Upsets, the Berg, Melanie; LaBel, Kenneth; Campola,

casey m c 2016

LaBel, Kenneth A.Szabo, Carl M.Chen, DakaiCampola, Michael J.Casey, Megan C.Lauenstein, Jean-MarieWilcox, Edward P.Ladbury, Raymond L

A First Look at 22 nm FDSOI SRAM Single-Event Test Results [

A First Look at 22 nm FDSOI SRAM Single-Event Test Results [STUB]Casey, Megan CStansberry, ScottSeidleck, Christina MMaharrey, Jeffrey A

Single-Event Effect Testing of the Vishay Si7414DN n-Type

Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFETLauenstein, J.MCasey, M. C

Single-Event Effects in Silicon Carbide Power

J.-M. Lauenstein, M. C. Casey, K. A. LaBel, S. Ikpe, A. D. Topper, E. P. Wilcox, H. Kim and A. M. Phan, Single-Event Effects in

Single-Event Threats for Diodes - Its Not Just Schottky Diodes

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

Compendium of Single Event Effects for Candidate Spacecraft

Compendium of Single Event Effects for Candidate Spacecraft Electronics for Casey, A.D. Topper, K.A. LaBel, J.A. Pellish, J.-M. Lauenstein,

single event study: Topics by WorldWideScience.org

single event upset (SEU) of semiconductor devices the relative transverse momentum k t at the M.; Fulcher, J.R.; Hall, G.; Huhtinen,

Failure Estimates for SiC Power MOSFETs in Space Electronics

(REDW) - Compendium of Current Single Event Effects Results from NASA Casey, Megan C.Lauenstein, Jean MarieWyrwas, Edward J.Guertin, Steven M

Single-Event Threats for Diodes - It%27s Not Just Schottky

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

Destructive Single-Event Effects in Diodes

Destructive Single-Event Effects in DiodesCampola, Michael JPhan, Anthony MLabel, Kenneth ACasey, Megan CLauenstein, JeanMarie

Megan C. Caseys research works

Megan C. Caseys 18 research works with 41 citations and 320 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

Methods and Systems for Account Management and Virtual Agent

label, node text message, node-related dates, specification are used therein as terms of Uhrig, Casey F.Johnson, Greg W.Nelson, Kyle J

Megan C. Caseys research works

Megan C. Caseys 18 research works with 41 citations and 320 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing

Data Workshop (REDW) - Compendium of Recent Single Event

(REDW) - Compendium of Recent Single Event Effects for Candidate SpacecraftLaBel, Kenneth A.Pellish, Jonathan A.Lauenstein, Jean-Marie

Compendium of Current Single Event Effects for Candidate… -

2016223-Power Devices by Jean-Marie Lauenstein, Megan C.Casey, Alyson J. Topper, Edward T. Wilcox, LaBelSingle-Event Effects Induced by Pulsed

2015 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE - PDF

[:30] Session C Single Event Effects: Devices C. Casey, E. P. Wilcox 2, J.-M. Lauenstein, A. D. Topper 2, K. A. LaBel

Megan C. Caseys research works

Megan C. Caseys 18 research works with 41 citations and 320 reads, including: NASA Goddard Space Flight Centers Compendium of Recent Total Ionizing